Technical Name High-Security IC Test Technology with Dynamic Keys
Project Operator National Cheng Kung University
Project Host 李昆忠
Summary We proposed a dynamic-key secure DFT structure that can generate the keys dynamicallydefend scan-basedmemory attacks without decreasing the system performancethe testability. Analysis results show that our method can achieve a very high security levelthe security level will not decrease no matter how many times the attacker guesses due to the dynamic characteristic of our method.
Scientific Breakthrough 1. Using the dynamic keymaintain a high security level.2. Generating the fake response to mislead the attacker.3. Hidding the secure design by embedding the key pin into the scan input pins.4. Do not need to share the test key with testers within the IC supply chain.
Industrial Applicability This technology can be widely used in the IC test architecture of products such as communication, automotive, home appliances, consumer electronics, etc. And maintain the in-field testabilityhigh security.
Keyword hardware security secure design of digital circuits secure test architecture dynamic key scan-based side-channel attack IC testing scan chain design for test memory attack cold boot attack
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